In Situ Characterization of Thin Film Growth

This book PDF is perfect for those who love Technology & Engineering genre, written by Gertjan Koster and published by Elsevier which was released on 05 October 2011 with total hardcover pages 296. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related In Situ Characterization of Thin Film Growth books below.

In Situ Characterization of Thin Film Growth
Author : Gertjan Koster
File Size : 49,6 Mb
Publisher : Elsevier
Language : English
Release Date : 05 October 2011
ISBN : 9780857094957
Pages : 296 pages
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In Situ Characterization of Thin Film Growth by Gertjan Koster Book PDF Summary

Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques

In Situ Characterization of Thin Film Growth

Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers

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