Scanning Nonlinear Dielectric Microscopy

This book PDF is perfect for those who love Technology & Engineering genre, written by Yasuo Cho and published by Woodhead Publishing which was released on 20 May 2020 with total hardcover pages 258. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related Scanning Nonlinear Dielectric Microscopy books below.

Scanning Nonlinear Dielectric Microscopy
Scanning Nonlinear Dielectric Microscopy
Author : Yasuo Cho
File Size : 42,7 Mb
Publisher : Woodhead Publishing
Language : English
Release Date : 20 May 2020
ISBN : 9780081028032
Pages : 258 pages
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Scanning Nonlinear Dielectric Microscopy by Yasuo Cho Book PDF Summary

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy by Yasuo Cho

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric

Get Book
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