SEM Microcharacterization of Semiconductors

This book PDF is perfect for those who love Technology & Engineering genre, written by D. B. Holt and published by Academic Press which was released on 22 October 2013 with total hardcover pages 452. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related SEM Microcharacterization of Semiconductors books below.

SEM Microcharacterization of Semiconductors

Author	: D. B. Holt
File Size	: 52,6 Mb
Publisher	: Academic Press
Language	: English
Release Date	: 22 October 2013
ISBN	: 9781483288673
Pages	: 452 pages

Get Book

SEM Microcharacterization of Semiconductors by D. B. Holt Book PDF Summary

Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.

SEM Microcharacterization of Semiconductors by D. B. Holt,D. C. Joy

Get Book

Advanced Scanning Electron Microscopy and X Ray Microanalysis by Patrick Echlin,C.E. Fiori,Joseph Goldstein,David C. Joy,Dale E. Newbury

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning

Get Book

Scanning Electron Microscopy and X Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays

Get Book

Microanalysis of Solids by B.G. Yacobi,L.L. Kazmerski,D.B. Holt

The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis

Get Book

Semiconductor Materials by B.G. Yacobi

The technological progress is closely related to the developments of various materials and tools made of those materials. Even the different ages have been defined in relation to the materials used. Some of the major attributes of the present-day age (i.e., the electronic materials’ age) are such common tools

Get Book

Capacitance Spectroscopy of Semiconductors by Jian V. Li,Giorgio Ferrari

Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four

Get Book

Scanning Electron Microscopy X Ray Microanalysis and Analytical Electron Microscopy by Charles E. Lyman,Dale E. Newbury,Joseph Goldstein,David B. Williams,Alton D. Romig Jr.,John Armstrong,Patrick Echlin,Charles Fiori,David C. Joy,Eric Lifshin,Klaus-Rüdiger Peters

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of

Get Book

Springer Handbook of Microscopy by Peter W. Hawkes,John C.H. Spence

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument

Get Book