Atomic Force Microscopy in Process Engineering

This book PDF is perfect for those who love Technology & Engineering genre, written by W. Richard Bowen and published by Butterworth-Heinemann which was released on 30 June 2009 with total hardcover pages 300. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related Atomic Force Microscopy in Process Engineering books below.

Atomic Force Microscopy in Process Engineering
Author : W. Richard Bowen
File Size : 43,6 Mb
Publisher : Butterworth-Heinemann
Language : English
Release Date : 30 June 2009
ISBN : 9780080949574
Pages : 300 pages
Get Book

Atomic Force Microscopy in Process Engineering by W. Richard Bowen Book PDF Summary

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products The only book dealing with the theory and practical applications of atomic force microscopy in process engineering Provides best-practice guidance and experience on using AFM for process and product improvement

Atomic Force Microscopy in Process Engineering

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who

Get Book
Electrical Atomic Force Microscopy for Nanoelectronics

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy

Get Book
Fundamentals of Atomic Force Microscopy

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all

Get Book
Noncontact Atomic Force Microscopy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.

Get Book
Atomic Force Microscopy

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Get Book
Atomic Force Microscopy Scanning Tunneling Microscopy 3

The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium

Get Book
Scanning Probe Microscopy

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the

Get Book
Application of Nanotechnology in Membranes for Water Treatment

The book focuses on Application of Nanotechnology in Membranes for Water Treatment but not only provides a series of innovative solutions for water reclamation through advanced membrane technology but also serves as a medium to promote international cooperation and networking for the development of advanced membrane technology for Universal well-being

Get Book