Author | : T. Mitch Wallis |
File Size | : 50,6 Mb |
Publisher | : Cambridge University Press |
Language | : English |
Release Date | : 14 September 2017 |
ISBN | : 9781107120686 |
Pages | : 329 pages |
Measurement Techniques for Radio Frequency Nanoelectronics by T. Mitch Wallis Book PDF Summary
Featuring numerous examples linking theoretical concepts with real-world applications, this practical, cross-disciplinary guide will help you understand the fundamentals of radio frequency measurement of nanoscale devices. -- Résumé abrégé du livre.