Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs

This book PDF is perfect for those who love Technology & Engineering genre, written by Alexandra Zimpeck and published by Springer Nature which was released on 10 March 2021 with total hardcover pages 131. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs books below.

Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs
Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs
Author : Alexandra Zimpeck
File Size : 47,5 Mb
Publisher : Springer Nature
Language : English
Release Date : 10 March 2021
ISBN : 9783030683689
Pages : 131 pages
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Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs by Alexandra Zimpeck Book PDF Summary

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.

Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs

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This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3),

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