X Ray Diffraction Imaging

This book PDF is perfect for those who love Technology & Engineering genre, written by Joel Greenberg and published by CRC Press which was released on 02 November 2018 with total hardcover pages 256. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related X Ray Diffraction Imaging books below.

X Ray Diffraction Imaging
Author : Joel Greenberg
File Size : 43,9 Mb
Publisher : CRC Press
Language : English
Release Date : 02 November 2018
ISBN : 9780429591808
Pages : 256 pages
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X Ray Diffraction Imaging by Joel Greenberg Book PDF Summary

This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike. Teaches novel methods for X-ray diffraction imaging Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms Features state-of-the-art work of international authors from both academia and industry. Includes practical applications in the medical, industrial, and security sectors

X Ray Diffraction Imaging

This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities

Get Book
X ray Diffraction Imaging

This book explores novel use of X-ray diffraction technology that opens an entirely new field of looking at objects, human organs, baggage suitcases, or contraband substances. The ability to perform spatially-resolved material discrimination significantly enhances the performance of medical and industrial radiography, as well as contraband and explosives detection systems.

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X Ray Diffraction Imaging of Biological Cells

In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7

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Inverse Fan Beam X ray Diffraction Imaging with Applications in Liquids Identification

The Inverse Fan-beam (IF) confi guration for X-ray Diffraction Imaging (XDI) and its capability of identifying liquid and amorphous substances for the purpose of explosive detection are described and investigated. Material specifi c information can be obtained by measuring x-ray diffraction profi-les from selected volume elements within inhomogeneous extended objects.

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Coherent X Ray Optics

X-ray optics is undergoing a renaissance, which may be paralleled to that experienced by visible-light optics following the invention of the laser. The associated surge of activity in "coherent" x-ray optics has been documented in this monograph, the first of its type in the field.

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X Ray Diffraction

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and

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X Ray Metrology in Semiconductor Manufacturing

The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first

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Coherent Domain Optical Methods

For the first time in one set of books, coherent-domain optical methods are discussed in the framework of various applications, which are characterized by a strong light scattering. A few chapters describe basic research containing the updated results on coherent and polarized light non-destructive interactions with a scattering medium, in

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