Advanced Metrology

This book PDF is perfect for those who love Technology & Engineering genre, written by X. Jane Jiang and published by Academic Press which was released on 08 April 2020 with total hardcover pages 376. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related Advanced Metrology books below.

Advanced Metrology

Author	: X. Jane Jiang
File Size	: 45,8 Mb
Publisher	: Academic Press
Language	: English
Release Date	: 08 April 2020
ISBN	: 9780128218167
Pages	: 376 pages

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Advanced Metrology by X. Jane Jiang Book PDF Summary

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software

Advanced Metrology by X. Jane Jiang,Paul J. Scott

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Optical Imaging and Metrology by Wolfgang Osten,Nadya Reingand

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field,

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Advanced Mathematical and Computational Tools in Metrology and Testing IX by Franco Pavese,Markus Bär,Jean-Rémy Filtz,Alistair B Forbes,Leslie Pendrill,Katsuhiro Shirono

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in

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Advanced Mathematical and Computational Tools in Metrology and Testing VIII by Franco Pavese

The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on

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Automotive Engine Metrology by Salah H. R. Ali

In recent decades, metrology—an accurate and precise technology of high quality for automotive engines—has garnered a great deal of scientific interest due to its unique advanced soft engineering techniques in design and diagnostics. Used in a variety of scientific applications, these techniques are now widely regarded as safer,

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Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma,David G. Seiler

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers

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Handbook of Silicon Semiconductor Metrology by Alain C. Diebold

Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay

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Fringe 2009 by Wolfgang Osten,Malgorzata Kujawinska

21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in

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