Author | : Klaus Graff |
File Size | : 43,7 Mb |
Publisher | : Springer Science & Business Media |
Language | : English |
Release Date | : 08 March 2013 |
ISBN | : 9783642975936 |
Pages | : 228 pages |
Metal Impurities in Silicon Device Fabrication by Klaus Graff Book PDF Summary
A discussion of the different mechanisms responsible for contamination together with a survey of their impact on device performance. The author examines the specific properties of main and rare impurities in silicon, as well as the detection methods and requirements in modern technology. Finally, impurity gettering is studied along with modern techniques to determine gettering efficiency. Throughout all of these subjects, the book presents only reliable and up-to-date data so as to provide a thorough review of recent scientific investigations.