Optical Metrology with Interferometry

This book PDF is perfect for those who love Technology & Engineering genre, written by Dahi Ghareab Abdelsalam Ibrahim and published by Cambridge Scholars Publishing which was released on 31 July 2019 with total hardcover pages 312. You could read this book directly on your devices with pdf, epub and kindle format, check detail and related Optical Metrology with Interferometry books below.

Optical Metrology with Interferometry
Author : Dahi Ghareab Abdelsalam Ibrahim
File Size : 46,5 Mb
Publisher : Cambridge Scholars Publishing
Language : English
Release Date : 31 July 2019
ISBN : 9781527537736
Pages : 312 pages
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Optical Metrology with Interferometry by Dahi Ghareab Abdelsalam Ibrahim Book PDF Summary

The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.

Optical Metrology with Interferometry

The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become

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Optical Metrology

Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of

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New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified

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