Author | : Anonim |
File Size | : 55,6 Mb |
Publisher | : Unknown |
Language | : English |
Release Date | : 27 April 1997 |
ISBN | : OCLC:946109367 |
Pages | : 0 pages |
Development and Application of In Situ Real Time and Ex Situ Characterization Techniques to Study the Growth of High Temperature Superconducting HTSC Films and Interfaces by Anonim Book PDF Summary
The objectives of this program are: (1) To demonstrate Time of Flight Ion Scattering and Recoil (ToF-ISARS) Spectroscopy and Spectroscopic Ellipsometry (SE) for in-situ and real time characterization of HTSC thin films and processes. (2) To study HTSC thin film processes and interface reactions.